[Invited Talk] Improving the Efficacy of IC Fault Testing Using Compressive Sensing
- Topic : [Invited Talk] Improving the Efficacy of IC Fault Testing Using Compressive Sensing
- Speaker: Stephen Tarsa
- Date: Tuesday, August 21st, 2012
- Time: 5:00 pm - 6:00 pm
- Venue: EE Bldg. No2. 142 / 臺灣大學電二142
